Available Models If you would like to request a quote, please indicate the number of standards you'd like for each model. Click on the button to add these items to your quote basket. Model No. Wafer Size Nominal Thickness Quantity FTS Recertification 100 mm, 125 mm, 150 mm, 200 mm and 300 mm all values FTS12-10100 300 mm 1010 nm FTS12-6750 300 mm 675 nm FTS12-4000 300 mm 400 nm FTS12-2000 300 mm 200 nm FTS12-1000 300 mm 100 nm FTS12-500 300 mm 50 nm FTS12-120 300 mm 12 nm FTS12-250 300 mm 25 nm FTS12-75 300 mm 7.5 nm FTS12-45 300 mm 4.5 nm FTS12-20 300 mm 2 nm FTS8-10100 200 mm 1010 nm FTS8-6750 200 mm 675 nm FTS8-4000 200 mm 400 nm FTS8-2000 200 mm 200 nm FTS8-1000 200 mm 100 nm FTS8-500 200 mm 50 nm FTS8-250 200 mm 25 nm FTS8-120 200 mm 12 nm FTS8-75 200 mm 7.5 nm FTS8-45 200 mm 4.5 nm FTS8-20 200 mm 2 nm FTS6-10100 150 mm 1010 nm FTS6-6750 150 mm 675 nm FTS6-4000 150 mm 400 nm FTS6-2000 150 mm 200 nm FTS6-1000 150 mm 100 nm FTS6-500 150 mm 50 nm FTS6-250 150 mm 25 nm FTS6-120 150 mm 12 nm FTS6-75 150 mm 7.5 nm FTS6-45 150 mm 4.5 nm FTS5-10100 125 mm 1010 nm FTS5-6750 125 mm 675 nm FTS5-4000 125 mm 400 nm FTS5-2000 125 mm 200 nm FTS5-1000 125 mm 100 nm FTS5-500 125 mm 50 nm FTS5-250 125 mm 25 nm FTS5-120 125 mm 12 nm FTS5-75 125 mm 7.5 nm FTS5-45 125 mm 4.5 nm FTS4-10100 100 mm 1010 nm FTS4-6750 100 mm 675 nm FTS4-4000 100 mm 400 nm FTS4-2000 100 mm 200 nm FTS4-1000 100 mm 100 nm FTS4-500 100 mm 50 nm FTS4-250 100 mm 25 nm FTS4-120 100 mm 12 nm FTS4-75 100 mm 7.5 nm FTS4-45 100 mm 4.5 nm

Model Number Information for Silicon Dioxide Film Thickness Film Thickness Standards are used to calibrate optical film thickness measurement instruments such as ellipsometers, reflectometers and spectrophotometers. The certified measurand is derived film thickness for fixed index of refraction 1.46 using a single layer, transparent, homogenous calculation model. Silicon Dioxide Film Thickness Standards are NIST traceable and NVLAP accredited under NVLAP Lab Code 200303-0.